A Rapid Modeling Technique for Measurable Improvements in Factory Performance

Andreas Peikert, Steven Brown, Josef Thoma
Infineon

Abstract

This paper discusses a methodology for quickly investigating problem areas in semiconductor wafer fabrication factories by creating a model for the production area of interest only (as opposed to a model of the complete factory operation). All other factory operations are treated as "black boxes". Specific assumptions are made to capture the effect of reentrant flow. This approach allows a rapid response to production questions when beginning a new simulation project. The methodology was applied to a cycle-time and capacity analysis of the photolithography operation for Infineon's Dresden wafer fab. The results of this simulation study are presented.

For a copy of this paper, please email [email protected] and include the title of the paper and your mailing address.

Call today for more information from Wright Williams & Kelly, Inc. Providing software solutions for productivity measurement and enhancement since 1991.

Back to Top

 

 

 

SITE MAP 1SITE MAP 2SITE MAP3

6200 Stoneridge Mall Road • 3rd Floor • Pleasanton, CA 94588 • Tel 925-399-6246 • Fax 925-396-6174
©1995-2015 Wright Williams & Kelly, Inc. • All Rights Reserved • Email: [email protected]